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Scanning Probe Microscope MultiMode AFM V

Main equipment

Description:  

Scanning Probe Microscope MultiMode AFM V with Active vibration isolation table

Modes:

  • CM - contact mode (including in fluids operation);
  • LFM - lateral force microscopy;
  • TM - tapping mode AFM;
  • HSTM - high speed tapping mode AFM;
  • PI - phase imaging;
  • TR - torsion resonance mode;
  • MFM - magnetic force imaging;
  • FM - force modulation;
  • C-AFM - conductive AFM;
  • STM - scanning tuneling microscopy;
  • EFM - electric force microscopy;
  • Nanoindentation - nanoindentation, scratching and wear testing.
Technical specification of the AFM:
  • Max resolution: 5120 lines;
  • Effectiveness scan size: 0,1 to 160 µm;
  • Smallest visible size (1px): < 0,02 nm;
  • Size of the sample: diameter < 15 mm, height < 7 mm;
  • CCD camera magnification: ca. 450x;
  • Heating device: Troom - 250o C.
Additional equipment:
  • Antistatic cap;
  • The Atmospheric Hood;
  • Cylinder Cap;
  • Passive antishaking tabble with soundproof cap;
  • Table Stable TS-150;
  • Scanners: 10 µm, 100 µm, 160 µm.

Technical specification of Table Stable TS-50:
  • Load range: 0 do 150 kg;
  • Frequency: 0,7 - 1000 Hz;
  • Dimensions: 400x450x75mm.


Contact Name:  Dr. Janusz Artur Rębiś

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