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X-ray diffractometer PHILIPS PW 1830 equipped with attachment for thin film analysis

Main equipment

Description:  

- qualitative phase analysis - ICDD search/match program, - quantitative phase analysis – our own Excel-type sheets, - microstresses and grain size analysis – DHN fitting plus our own Excel-type sheets - lattice parameters – DHN program, - indexing of unknown phases – DHN program - simulation of powder diffraction pattern from modeled structure with simple graphical facilities – SMOG module in DHN program, - Rietveld analysis – DBWS98/ DMPLOT programs.

Contact Name:  Prof. Jarosław Mizera

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