Scanning electron microscope HITACHI S-3500N
Scanning electron microscope HITACHI S-3500N equipped with secondary and backscatter detectors as well as Robinson detector. The microscope is able to work at variable pressure conditions of vacuum (ability of non-conductive materials analysis). Features
High resolution imaging in both conventional high vacuum and unique variable pressure modes.
a) 3.0 nm resolution guaranteed in high vacuum mode or 4.5 nm in VP-mode.
Unique VP-mode of operation
a) The VP-mode allows microscopy of wet, oily and non-conductive samples in their natural state with-out the need of conventional sample preparation.
a) Comfortable working GUI environment
b) Mouse driven menus for changing operating modes with pressure settings ranging from 1 Pa through 270 Pa in the sample chamber.
Wide range of optional accessories
a) EDS (Thermo NORAN VANTAGE)
b) Secondary and backscatter electron detectors as well as Robinson detector
c) module (DEBEN RESEARCH MICROTEST) enables to do in-situ observation of the material under loading
Integration of EDX spectrometer utilizing a remote mouse and keyboard operation software available (option).
Machine available in the Faculty of Materials Science and Engineering at the Warsaw University of Technology offers a wide spectrum of the SEM investigations. Attachments of the machine and experience of the workers allows characterization of the materials microstructure at the sophisticated level including fracture surface description, chemical composition analysis, and - in the nearest future - full crystallographic description and phase identification by electron back scatter diffraction (EBSD) analyzing system. Also, non-conductive materials might be directly observed with no coatings required by conventional SEM due to the low vacuum mode option. In order to attempt a full understanding of the materials behavior the SEM in situ straining experiment is offered with tensile stage, which offers o load up to 2000 N.
Characterization of the materials in a wide range offered by SEM:
- Microstructure characterization including fracture analysis
- Characterization of the precipitates morphology
- Energy Dispersive Spectroscopy (EDS) of the chemical composition and elements distribution
- SEM in situ straining experiments
- Direct observation of non conductive materials
- A full crystallographic description of the polycrystalline microstructure (soon)
- Phase identification
Contact Name: Dr. Witold ZieliĆski