MATERIALS DESIGN DIVISION
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FIB Focused Ion Beam

Main equipment

Description:  

Focused Ion beam instrument type FB2100 made by Hitachi, it is very modern tool for preparation samples and investigations of materials microstructure, which are difficult for preparation traditional techiques. On this unit, composite materials like diamond particles in metallic matrix, thin layers, powders can be prepared for examination in TEM or SEM. Main parameters: - liquid ion source (Ga) - accelerating voltage 40kV - beam current from 0,01 nA to 45 nA - resolution 6 nm - max. magnification x90000

Contact Name:  Dr. Tomasz Płociński

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